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Derniers dépôts
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Juan Esteban Montoya Cardona, Sylvain Joblot, Richard Monflier, Éric Imbernon, Aubin Antonsanti, et al.. Detection of Neutron Irradiation-Induced Crystal Defects in Silicon with Photoluminescence, Deep Level Transient Spectroscopy and Dark Current Measurements on CMOS Image Sensors. RADiation Effects on Components and Systems, Sep 2024, Maspalomas, Spain. ⟨hal-04931209⟩
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Juan Esteban Montoya Cardona, Sylvain Joblot, Pierre Kermagoret, Grégoire Ducotey, Stéphane Hardillier, et al.. Effect of Metallic Ion Implantation on Dark Current Distributions of Silicon-Based CMOS Image Sensors. 2024 IEEE SENSORS, Oct 2024, Kobe, Japan. ⟨10.1109/SENSORS60989.2024.10784529⟩. ⟨hal-04888080⟩
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